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Laboratory test SELFA for nanomaterial safety screening

 
Electronics News
7 years ago

Laboratory test SELFA for nanomaterial safety screening


A test developed at UCLA uses lab-on-a-chip technology to predict how hazardous engineered nanomaterials might be. It could also be used to identify biological biomarkers that can help scientists and doctors detect cancer and infectious diseases.

The new platform, which is called semiconductor electronic label-free assay, or SELFA, is said to cost less and be faster and more accurate than previous tests, including the enzyme-linked immunosorbent assay, or ELISA.

The SELFA chip contains a T-shaped nanowire that acts as an integrated sensor and amplifier. To analyse a sample, scientists place it on a sensor on the chip. The vertical part of the T-shaped nanowire converts the current from the molecule being analysed, and the horizontal part amplifies that signal to distinguish the molecule from others.

“By measuring biomarker concentrations in the cell culture, we showed that SELFA was 100 times more sensitive than ELISA,” Huan Meng, a UCLA assistant adjunct professor, said. “This means that not only can SELFA analyse smaller sample sizes, but also that it can minimise false-positive test results.”

Author
Peggy Lee

Source:  www.newelectronics.co.uk


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