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NI announces Engineering Impact Awards finalists

 
Electronics News
8 years ago

NI announces Engineering Impact Awards finalists


National Instruments (NI) has announced the shortlist of finalists for its 2015 Engineering Impact Awards, which honour Northern Europe’s most innovative engineering projects using NI software and hardware.

The finalists in this year’s Engineering Impact Awards have combined their expertise with NI tools, in order to solve challenging engineering problems.

This year’s finalists include Quantum Detectors that has used LabVIEW and FlexRIO to reduce development time of a high-speed X-ray imaging system. ON Semiconductor and Fingerprint Cards AB go head-to-head in the Electronics Test and Measurement category. ON Semiconductor has developed mixed-signal automated test equipment production tester for its new generation image sensors. Fingerprint Cards has created a validation system for fingerprint identification chips in mobile devices.

In the Internet of Things category, TBG Solutions has used Single-Board RIO and LabVIEW to develop a network of smart devices to monitor household energy efficiency. A team from National Grid UK has adopted a platform based on CompactRIO to analyse large amounts of data from the grid to adapt the efficiency of the grid as renewable energy supplements fossil fuel usage over time.

In the Student Design Competition the University of Leeds has entered a team that has developed a haptic simulator with augmented reality visual feedback for medical training using MyRIO and LabVIEW to simulate needle insertion in lumbar puncture procedures or laparoscopic surgery.

Winners will be announced at the Engineering Impact Awards ceremony, held at The Royal Academy of Engineering, London, on Monday 2nd November. Several finalists will also present their applications in technical sessions at the NIDays conference the following day.

Pic: Fingerprint Cards AB has created a validation system for fingerprint identification chips in mobile devices

Author
Tom Austin-Morgan

Source:  www.newelectronics.co.uk


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