Keysight FITS-16CH Digital Test System Validates High-Speed Interconnects
Keysight Technologies has introduced the Functional Interconnect Test Solutions (FITS)-16CH, a digital-layer error performance validation system for optical, active copper and passive copper interconnects. With 16 transmit and 16 receive channels (twice the density of the previous FITS-8CH), the platform is designed to validate complete interconnect assemblies used in AI and network infrastructure.
Keysight FITS-16CH digital-layer interconnect test system
Key Characteristics
Channels: 16 TX + 16 RX (2× density of FITS-8CH)
Supported lane rates: 106G and 212G for 800G interconnects and emerging 1.6T technologies
Measurement types: Bit Error Ratio (BER) and Forward Error Correction (FEC) at the digital layer
Supported interconnects:
Full-retimed optics (FRO)
Active optical cables (AOCs)
Linear-retimed optics (LRO)
Linear pluggable optics (LPO)
Active copper cables (ACCs)
Active electrical cables (AECs)
Passive direct attach cables (DACs)
High-speed copper flyover cables
Two Module Compliance Boards (MCBs) with independent channel groups for simultaneous multi-lane testing
Large insertion-loss budget for testing through lossy channels and customer fixtures
Windows 11 GUI integrated with Keysight DCA-X analyser
Automated lane tuning: calculates optimal TX FIR filter taps to open the electrical eye (reduces tuning time from hours/days to minutes)
By combining digital-layer BER/FEC measurements with high channel density and automated eye opening, FITS-16CH provides system-level validation of complete interconnect assemblies under real-world conditions — beyond traditional physical-layer testing alone.
Target Applications
R&D, design and manufacturing of interconnects for AI and data-centre networks
Validation of silicon chips, networking equipment and cable assemblies
Pre- and post-production performance benchmarking by data-centre operators
