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Archive : 25 October 2026 год


12:23Keysight FITS-16CH Digital Test System Validates High-Speed Interconnects

Keysight Technologies has introduced the Functional Interconnect Test Solutions (FITS)-16CH, a digital-layer error performance validation system for optical, active copper and passive copper interconnects. With 16 transmit and 16 receive channels (twice the density of the previous FITS-8CH), the platform is designed to validate complete interconnect assemblies used in AI and network infrastructure.

Keysight FITS-16CH digital test system

Keysight FITS-16CH digital-layer interconnect test system

Key Characteristics

  • Channels: 16 TX + 16 RX (2× density of FITS-8CH)
  • Supported lane rates: 106G and 212G for 800G interconnects and emerging 1.6T technologies
  • Measurement types: Bit Error Ratio (BER) and Forward Error Correction (FEC) at the digital layer
  • Supported interconnects:
    • Full-retimed optics (FRO)
    • Active optical cables (AOCs)
    • Linear-retimed optics (LRO)
    • Linear pluggable optics (LPO)
    • Active copper cables (ACCs)
    • Active electrical cables (AECs)
    • Passive direct attach cables (DACs)
    • High-speed copper flyover cables
  • Two Module Compliance Boards (MCBs) with independent channel groups for simultaneous multi-lane testing
  • Large insertion-loss budget for testing through lossy channels and customer fixtures
  • Windows 11 GUI integrated with Keysight DCA-X analyser
  • Automated lane tuning: calculates optimal TX FIR filter taps to open the electrical eye (reduces tuning time from hours/days to minutes)

By combining digital-layer BER/FEC measurements with high channel density and automated eye opening, FITS-16CH provides system-level validation of complete interconnect assemblies under real-world conditions — beyond traditional physical-layer testing alone.

Target Applications

  • R&D, design and manufacturing of interconnects for AI and data-centre networks
  • Validation of silicon chips, networking equipment and cable assemblies
  • Pre- and post-production performance benchmarking by data-centre operators

Source: Electronics For You